18th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF-2019)

25-28 June 2019, University of Girona, Spain

  • Scientific Programme

    Invited Speakers

    • Laura Borgese, University of Brescia, Italy
      “European Network for chemical elemental analysis by total reflection X-ray fluorescence”
    • Sangita Dhara, Bhabha Atomic Reserch Center, India
      “TXRF for elemental characterization of nuclear materials: Some recent studies”
    • Ramón Fernández, Autonomous University of Madrid, Spain
      “Considerations about the effect of chemical atomic surrounding in the quantitative analysis by TXRF”
    • Jun Kawai, Kyoto University, Japan
      “TXRF and polarized XRF spectrometer with 3D printer”
    • Galina Pashkova, Siberian Branch of the Russian Academy of Sciences, Russia
      “Characterization of sediment composition by TXRF: Tips and tricks”
    • Giancarlo Pepponi, Fondazione Bruno Kessler, Italy
      “Arrays of linear, energy dispersive x-ray detectors for combined fluorescence and scattering characterization”
    • Sofia Pessanha, Universidade Nova de Lisboa, Portugal
      “Comparison of TXRF and portable EDXRF system with triaxial geometry in the analysis of contaminated waters”
    • Pawel Wrobel, AGH University of Science and Technology, Poland
      “Challenges of trace element analysis of human samples”
  • Social Programme

    To be defined soon

Cookies help us deliver our services. By using our services, you agree to our use of cookies Learn more